Equipment

Rotary bending fatigue tester (YRB200)Tensile tester (AGS, 5kN)
Micro-material tester (MMT250)Tensile tester (AG-5000D, 50kN)
Tensile tester (AG-2000C, 20kN)Tensile tester (AGX, 50kN)
Field-emission scanning electron microscope
(JSM-7100F)
Scanning electron microscope (JSM-6510)
Focused ion beam system (SMI-3050SE)Digital microscope
Optical microscopeStereo microscope
Measuring microscopeVickers hardness tester

link to: High-voltage electron microscope laboratory, IMaSS (Nagoya University)

Cross section polisher (IB-09020CP)Ion slicer
Diamond wheel sawTube furnace (gas env.)
Vacuum furnaceThermostatic chamber
Micro drillMicro electronic balance
Finite element analysis (ABAQUS)Digital image correlation (DIPP strain)
OIM analysis for EBSD3D viewer (MeX)